Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12569796Application Date: 2009-09-29
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Publication No.: US08165027B2Publication Date: 2012-04-24
- Inventor: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: H04J1/16
- IPC: H04J1/16

Abstract:
There is provided a test apparatus for testing at least one device under test, including a packet list storing section that stores a plurality of packet lists each of which includes a series of packets communicated between the test apparatus and the at least one device under test, a flow control section that designates an order of executing the plurality of packet lists in accordance with an execution flow of a test program that is designed to test the at least one device under test, and a packet communicating section that sequentially communicates the series of packets included in packet lists sequentially designated by the flow control section between the test apparatus and the at least one device under test, to test the at least one device under test.
Public/Granted literature
- US20100142392A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2010-06-10
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