Invention Grant
- Patent Title: Assessment of a view through the overlay of maps
- Patent Title (中): 通过覆盖地图评估视图
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Application No.: US11945283Application Date: 2007-11-27
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Publication No.: US08165350B2Publication Date: 2012-04-24
- Inventor: Oded Fuhrmann , Dan Pelleg
- Applicant: Oded Fuhrmann , Dan Pelleg
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Dan Swirsky
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/46 ; G06K9/66

Abstract:
A system for evaluating a view, including a first mapper for encoding an image of a view according to a first parameter to create a first map having multiple defined areas, a second mapper for encoding the image according to a second parameter to create a second map having multiple defined areas, an overlap mapper for combining the maps to create an overlap map, a tabulator for measuring areas in the overlap map corresponding to overlapping defined areas, creating a set of measurements of the image, and an analyzer for analyzing the set of measurements of the image and a learning set of measurement groups with associated values to compute an estimated value associated with the image where the estimated value relates to the set of measurements of the image in the same manner that each value in the learning set relates to its associated measurement group.
Public/Granted literature
- US20090136155A1 Assessment of a View through the Overlay of Maps Public/Granted day:2009-05-28
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