Invention Grant
- Patent Title: Calibration of an instrument location facility with an imaging apparatus
- Patent Title (中): 用成像设备校准仪器定位设备
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Application No.: US12378003Application Date: 2009-02-10
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Publication No.: US08165839B2Publication Date: 2012-04-24
- Inventor: Jan Boese , Matthias John
- Applicant: Jan Boese , Matthias John
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Priority: DE102008009266 20080215
- Main IPC: G01D21/00
- IPC: G01D21/00 ; G06F19/00

Abstract:
A method is proposed for calibrating an instrument location facility with an imaging apparatus. The instrument location apparatus and the imaging apparatus are synchronized temporally with one another. According to such synchronization at least three points of the position of a medical instrument relative to a tracking coordinate system of the instrument location apparatus and/or relative to an image coordinate system of the imaging apparatus are measured simultaneously both by the instrument location apparatus and by the imaging apparatus. The instrument and/or the imaging apparatus are moved relative to one another between the measurements. The measured points parameterize a predetermined transformation rule for mapping the tracking coordinate system onto the image coordinate system.
Public/Granted literature
- US20090205403A1 Calibration of an instrument location facility with an imaging apparatus Public/Granted day:2009-08-20
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