Invention Grant
- Patent Title: Method and apparatus for judging position shift
- Patent Title (中): 判断位置偏移的方法和装置
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Application No.: US12244213Application Date: 2008-10-02
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Publication No.: US08165843B2Publication Date: 2012-04-24
- Inventor: Muneyasu Kimura
- Applicant: Muneyasu Kimura
- Applicant Address: JP Tokyo
- Assignee: Fujifilm Corporation
- Current Assignee: Fujifilm Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2007-258379 20071002
- Main IPC: G01P13/00
- IPC: G01P13/00

Abstract:
Time-course data that has been obtained by measuring, in time series, a change in the density of a sample material by a color reaction thereof is input. A regression curve generation unit generates a regression curve that approximates the time-course data. A standard deviation obtainment unit obtains the value of a standard deviation representing the distribution of the approximation error of the regression curve with respect to the time-course data. A standard deviation comparison judgment unit compares the value of the standard deviation and a predetermined threshold value that is stored in a standard deviation storage unit with each other. When the value of the standard deviation is greater than the threshold value, the standard deviation comparison judgment unit judges that a position shift of the sample material with respect to a sample table is present and outputs the result of the judgment.
Public/Granted literature
- US20090099809A1 METHOD AND APPARATUS FOR JUDGING POSITION SHIFT Public/Granted day:2009-04-16
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