Invention Grant
- Patent Title: XML/database/XML layer analysis
- Patent Title (中): XML /数据库/ XML层分析
-
Application No.: US12179945Application Date: 2008-07-25
-
Publication No.: US08165999B2Publication Date: 2012-04-24
- Inventor: Mohan K. Jadhav , Debarshi Raha
- Applicant: Mohan K. Jadhav , Debarshi Raha
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Sughrue Mion, PLLC.
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/00

Abstract:
An automated method for testing XML/Database/XML layers. To the extent that XML is the de facto communication standard for today's middleware products, most of the middleware products need to produce/accept XML data at some interfaces. This data either comes from or needs to be persisted into DB (database). Two end points are thus represented by XML input/output and DB. To ensure the accuracy of data at the two end points, the same data are typically converted from one format to another between the end points. Manual verification in this vein is possible for development purposes, but in practice this presents inefficiencies if done repeatedly. Accordingly, there is broadly contemplated herein an automation technique to verify the accuracy of data at the two end points.
Public/Granted literature
- US20100023539A1 XML/DATABASE/XML LAYER ANALYSIS Public/Granted day:2010-01-28
Information query