Invention Grant
- Patent Title: Temperature measurement instruments and methods for identifying a selected target area
- Patent Title (中): 用于识别所选目标区域的温度测量仪器和方法
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Application No.: US12354104Application Date: 2009-01-15
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Publication No.: US08167483B2Publication Date: 2012-05-01
- Inventor: John Steffen Jensen
- Applicant: John Steffen Jensen
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Fredrikson & Byron, PA
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01J5/02

Abstract:
Temperature measurement instruments and methods are provided for visually identifying a selected area of a target with a light beam. After imaging infrared radiation from a measurement area on a target, a selected area satisfying a temperature criterion is determined. An actuator system moves a light beam relative to the instrument and measurement area to visually identify the selected area. In some embodiments the actuator system may repeatedly move the light beam to visually identify the selected area of the target as the instrument is moved and the selected area's position changes within the measurement area.
Public/Granted literature
- US20100179785A1 Temperature Measurement Instruments and Methods for Identifying a Selected Target Area Public/Granted day:2010-07-15
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