Several novel probes are shown, highlighting the designs and non-linear spring rates of their contact springs. These springs work in conjunction with a novel comb, which affects the movement of the springs tips, so as to create the desirable scrub or wipe at the surface of the contact pads of the devices under test. At least three versions of the probes are covered by the claims, where one probe works on one device, a second probe works on two devices and the third probe comprises a lid, which controls the protrusion distance of the spring tips above the housing surface, so as to protect the springs from getting damaged prematurely.