Invention Grant
- Patent Title: Method for evaluating internal short-circuit of battery, device for evaluating internal short-circuit of battery, battery, battery pack and their manufacturing methods
- Patent Title (中): 电池内部短路评估方法,电池,电池,电池组内部短路评估装置及其制造方法
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Application No.: US12446869Application Date: 2007-11-21
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Publication No.: US08168314B2Publication Date: 2012-05-01
- Inventor: Masato Fujikawa , Shinji Kasamatsu , Hajime Nishino , Mikinari Shimada
- Applicant: Masato Fujikawa , Shinji Kasamatsu , Hajime Nishino , Mikinari Shimada
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-338114 20061215; JP2007-026742 20070206; JP2007-278044 20071025
- International Application: PCT/JP2007/072553 WO 20071121
- International Announcement: WO2008/072456 WO 20080619
- Main IPC: H01M2/00
- IPC: H01M2/00 ; H01M10/48

Abstract:
Methods for evaluating battery safety under internal short-circuit conditions are improved to eliminate variations in evaluation results and accurately evaluate battery safety under internal short-circuit conditions. An internal short-circuit is caused in a battery by using an internal short-circuit causing method in which battery information obtained upon the occurrence of an internal short-circuit hardly changes with the structure of the battery. At this time, the battery information is detected to accurately evaluate the safety of the battery upon the internal short-circuit and identify the safety level.
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