Invention Grant
- Patent Title: Chromatograph mass spectrometer
- Patent Title (中): 色谱质谱仪
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Application No.: US12281698Application Date: 2006-03-07
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Publication No.: US08168942B2Publication Date: 2012-05-01
- Inventor: Takashi Sumiyoshi
- Applicant: Takashi Sumiyoshi
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2006/304371 WO 20060307
- International Announcement: WO2007/102201 WO 20070913
- Main IPC: B01D59/44
- IPC: B01D59/44

Abstract:
In a chromatograph mass spectrometer capable of defining an appropriate measurement time range and selectively performing a scan measurement, selected ion monitoring (SIM) measurement or simultaneous scan/SIM measurement in that time range, a total ion chromatogram 51 obtained by a scan measurement of a standard sample and a previously-created compound table 52 are displayed on the screen of a display unit in the process of setting parameters in a measurement condition table. An operator selects a compound that should undergo the simultaneous scan/SIM measurement, then places a checkmark in an appropriate check box in the compound table 52, and finally clicks the “Auto-Create” button 54. Then, a measurement time range for the selected compound is defined by adding a time span before and after the retention time of that compound, respectively, and a measurement condition table 53 is automatically created and displayed on the screen. This table includes instructions for performing a simultaneous scan/SIM measurement at specific mass-to-charge ratios characteristic of the selected compound during the aforementioned measurement time range.
Public/Granted literature
- US20090008542A1 Chromatograph Mass Spectrometer Public/Granted day:2009-01-08
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