A semiconductor memory cell, and method of manufacturing a semiconductor memory cell and an method of operating a semiconductor memory cell. A method of operating may include programming a semiconductor memory cell by applying a preset programming voltage to a common source and/or an N-well region, grounding and/or floating a control gate, and/or grounding a word line and/or a bit line. A method of operating may include erasing a semiconductor memory cell by floating and/or grounding a word line, applying a preset erase voltage to a control gate, and/or grounding an N-well, a bit line and/or a common source. A method of operating may include reading a semiconductor memory cell by grounding and/or floating a control gate, applying a preset read voltage to an N-well and/or a common source, grounding a word line, and/or applying a preset drain voltage to a bit line.