Invention Grant
- Patent Title: Methods of erase verification for a flash memory device
- Patent Title (中): 闪存设备的擦除验证方法
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Application No.: US12909414Application Date: 2010-10-21
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Publication No.: US08169832B2Publication Date: 2012-05-01
- Inventor: Vishal Sarin , Dzung Nguyen , Jonathan Pabustan , Jung Sheng Hoei , Jason Guo , William Saiki
- Applicant: Vishal Sarin , Dzung Nguyen , Jonathan Pabustan , Jung Sheng Hoei , Jason Guo , William Saiki
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
Methods and apparatus are disclosed, such as those involving a flash memory device that includes a memory block. The memory block includes a plurality of data lines extending substantially parallel to one another, and a plurality of memory cells. One such method includes erasing the memory cells; and performing erase verification on the memory cells. The erase verification includes determining one memory cell by one memory cell whether the individual memory cells coupled to one of the data lines have been erased. The method can also include performing a re-erase operation that selectively re-erases unerased memory cells based at least partly on the result of the erase verification.
Public/Granted literature
- US20110032761A1 METHODS OF ERASE VERIFICATION FOR A FLASH MEMORY DEVICE Public/Granted day:2011-02-10
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