Invention Grant
US08170819B2 Systems and methods for measuring non-linear characteristics of a power amplifier
失效
用于测量功率放大器的非线性特性的系统和方法
- Patent Title: Systems and methods for measuring non-linear characteristics of a power amplifier
- Patent Title (中): 用于测量功率放大器的非线性特性的系统和方法
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Application No.: US12108302Application Date: 2008-04-23
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Publication No.: US08170819B2Publication Date: 2012-05-01
- Inventor: Revathi Sundara Raghavan , Puay Hoe See , Rema Vaidyanathan , Richard M. Schierbeck, II , Sudarsan Krishnan , Zae Yong Choi
- Applicant: Revathi Sundara Raghavan , Puay Hoe See , Rema Vaidyanathan , Richard M. Schierbeck, II , Sudarsan Krishnan , Zae Yong Choi
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM, Incorporated
- Current Assignee: QUALCOMM, Incorporated
- Current Assignee Address: US CA San Diego
- Agent William M. Hooks
- Main IPC: G01R13/00
- IPC: G01R13/00 ; G01R23/00 ; H04B1/04
Abstract:
A method for measuring non-linear characteristics of a power amplifier is described. A calibration waveform is calculated during a testing procedure period. Amplitude characteristics of the calibration waveform at the output of the power amplifier are measured during the testing procedure period. Phase characteristics of the calibration waveform at the output of the power amplifier are measured during the testing procedure period. Pre-distortion techniques are configured based on the amplitude characteristics and the phase characteristics to be used during a normal operation period of a transmitter.
Public/Granted literature
- US20090138226A1 SYSTEMS AND METHODS FOR MEASURING NON-LINEAR CHARACTERISTICS OF A POWER AMPLIFIER Public/Granted day:2009-05-28
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