Invention Grant
US08171440B2 Timing analyzing apparatus, timing analyzing method and program thereof 有权
定时分析装置,时序分析方法及程序

  • Patent Title: Timing analyzing apparatus, timing analyzing method and program thereof
  • Patent Title (中): 定时分析装置,时序分析方法及程序
  • Application No.: US12537133
    Application Date: 2009-08-06
  • Publication No.: US08171440B2
    Publication Date: 2012-05-01
  • Inventor: Koji Kanno
  • Applicant: Koji Kanno
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2008-211549 20080820
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Timing analyzing apparatus, timing analyzing method and program thereof
Abstract:
A timing analyzing apparatus according to an exemplary aspect of the invention includes, a storage apparatus which stores a global clock list including information on clock paths inside and outside a partial area of an electronic circuit, and a post layout processing area netlist which is a netlist of the partial area after layout processing of circuits therein is executed; and a timing analyzing unit which calculates the clock skew between two points on the circuits in the partial area, neglecting the clock delay of a common part outside thereof of two clock paths from the clock source, located outside thereof in the electronic circuit, to the two points (CRPR calculation), to judge whether the delay of a clock path and a signal path of the electronic circuit satisfies timing constraints using the calculated clock skew.
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