Invention Grant
- Patent Title: Polish pad conditioning in mechanical polishing systems
- Patent Title (中): 抛光抛光系统中的抛光垫调节
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Application No.: US12274140Application Date: 2008-11-19
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Publication No.: US08172647B2Publication Date: 2012-05-08
- Inventor: Eugene C. Davis , Gul Bahar Basim
- Applicant: Eugene C. Davis , Gul Bahar Basim
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Alan A. R. Cooper; Wade James Brady, III; Frederick J. Telecky, Jr.
- Main IPC: B24B1/00
- IPC: B24B1/00

Abstract:
A mechanical polishing apparatus includes a polishing pad, at least one carrier head positioned over and off center relative to the polishing pad and configured for holding at least one substrate against the polishing pad within a first annular region of the polishing pad when the polishing pad is rotating. At least one conditioning head is positionable over and off center relative the polishing pad at a plurality of first positions and configured for applying a contacting surface of at least one conditioning pad against the polishing pad when the polishing pad is rotating, where the conditioning pad is applied to a second annular region of the polishing pad and moves between the plurality of first positions. In the apparatus, the diameter of the conditioning pad≦a difference between a radius of the polishing pad and a width of the first annular region.
Public/Granted literature
- US20100124871A1 POLISH PAD CONDITIONING IN MECHANICAL POLISHING SYSTEMS Public/Granted day:2010-05-20
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