Invention Grant
US08172759B2 Methods and systems for detecting epileptic events using nonlinear analysis parameters
有权
使用非线性分析参数检测癫痫事件的方法和系统
- Patent Title: Methods and systems for detecting epileptic events using nonlinear analysis parameters
- Patent Title (中): 使用非线性分析参数检测癫痫事件的方法和系统
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Application No.: US12429746Application Date: 2009-04-24
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Publication No.: US08172759B2Publication Date: 2012-05-08
- Inventor: Vladislav Bukhman
- Applicant: Vladislav Bukhman
- Applicant Address: US TX Houston
- Assignee: Cyberonics, Inc.
- Current Assignee: Cyberonics, Inc.
- Current Assignee Address: US TX Houston
- Agency: Cyberonics, Inc.
- Main IPC: A61B5/0205
- IPC: A61B5/0205

Abstract:
Disclosed herein are methods, systems, and apparatus for detecting an epilepsy event in a patient using a medical device. The medical device is capable of determining an occurring epilepsy event, for example a seizure or an increased risk of a seizure. The determination is performed by determining at least one nonlinear analysis parameter associated with the beat sequence of the patient's heart. The medical device may then take a responsive action, such as warning, logging the time of the seizure, computing and storing one or more seizure severity indices, and treating the epilepsy event.
Public/Granted literature
- US20100274303A1 Methods and Systems for Detecting Epileptic Events Using Nonlinear Analysis Parameters Public/Granted day:2010-10-28
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