Invention Grant
- Patent Title: Ion analyzing apparatus and ion analyzing method
- Patent Title (中): 离子分析仪和离子分析方法
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Application No.: US13227596Application Date: 2011-09-08
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Publication No.: US08173069B2Publication Date: 2012-05-08
- Inventor: Ryozo Takasu
- Applicant: Ryozo Takasu
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2009-188862 20090818
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N33/48 ; G01N15/06

Abstract:
An ion analyzing apparatus includes a sensor; a counter electrode having openings, the counter electrode being positioned so as to substantially surround the sensor; and a bias generating circuit coupled to the sensor, wherein the sensor includes quartz crystal and a pair of electrodes positioned on surface of the quartz crystal, and one of the pair of electrodes is coupled to the bias generating circuit.
Public/Granted literature
- US20110316550A1 ION ANALYZING APPARATUS AND ION ANALYZING METHOD Public/Granted day:2011-12-29
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