Invention Grant
- Patent Title: Iron silicide sputtering target and method for production thereof
- Patent Title (中): 铁硅化物溅射靶及其制造方法
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Application No.: US10527320Application Date: 2003-09-01
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Publication No.: US08173093B2Publication Date: 2012-05-08
- Inventor: Kunihiro Oda , Ryo Suzuki
- Applicant: Kunihiro Oda , Ryo Suzuki
- Applicant Address: JP Tokyo
- Assignee: JX Nippon Mining & Metals Corporation
- Current Assignee: JX Nippon Mining & Metals Corporation
- Current Assignee Address: JP Tokyo
- Agency: Howson & Howson LLP
- Priority: JP2002-265447 20020911
- International Application: PCT/JP03/11152 WO 20030901
- International Announcement: WO2004/024977 WO 20040325
- Main IPC: B22F1/00
- IPC: B22F1/00 ; B22F1/02 ; C22C1/04 ; C22C29/12 ; H01F1/00 ; C01B21/068 ; C01B33/06 ; H01L21/44

Abstract:
Provided is an iron silicide sputtering target in which the oxygen as the gas component in the target is 1000 ppm or less, and a manufacturing method of such iron silicide sputtering target including the steps of melting/casting high purity iron and silicon under high vacuum to prepare an alloy ingot, subjecting the ingot to gas atomization with inert gas to prepare fine powder, and thereafter sintering the fine powder. With this iron silicide sputtering target, the amount of impurities will be reduced, the thickness of the βFeSi2 film during deposition can be made thick, the generation of particles will be reduced, a uniform and homogenous film composition can be yielded, and the sputtering characteristics will be favorable. The foregoing manufacturing method is able to stably produce this target.
Public/Granted literature
- US20060057014A1 Iron silicide sputtering target and method for production thereof Public/Granted day:2006-03-16
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