Invention Grant
- Patent Title: Method of detecting or quantitating endogenous wheat DNA and method of determining contamination rate of genetically modified wheat in test sample
- Patent Title (中): 检测或定量内源性小麦DNA的方法和测定样品中转基因小麦污染率的方法
-
Application No.: US12300973Application Date: 2007-05-11
-
Publication No.: US08173400B2Publication Date: 2012-05-08
- Inventor: Shinjiro Imai , Keiko Tanaka
- Applicant: Shinjiro Imai , Keiko Tanaka
- Applicant Address: JP Tokyo
- Assignee: Nisshin Seifun Group Inc.
- Current Assignee: Nisshin Seifun Group Inc.
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2006-135835 20060515
- International Application: PCT/JP2007/059727 WO 20070511
- International Announcement: WO2007/132760 WO 20071122
- Main IPC: C12P19/34
- IPC: C12P19/34 ; C12Q1/68

Abstract:
An object of the present invention is to discover an endogenous wheat sequence satisfying the conditions of: a) it is universally present in varieties of wheat, b) the amount present (detected amount) is not affected by the wheat variety, c) even if other grains are present, only wheat can be detected without cross-reactivity, and d) it is amplified quantitatively by the PCR reaction. A further object of the present invention is to provide a method of accurately detecting and quantitating endogenous wheat DNA in a test sample by the polymerase chain reaction. The present invention provides a method of detecting or quantitating endogenous wheat DNA in a test sample by the polymerase chain reaction, the method comprising: a step of using a nucleic acid molecule in the test sample or a nucleic acid molecule extracted from the test sample as a template to amplify the nucleic acid molecule of a region consisting of the nucleotide sequence identified as SEQ ID NO: 2 or a partial sequence thereof with a primer pair capable of amplifying that region; and a step of detecting or quantitating the amplified nucleic acid molecule.
Public/Granted literature
Information query