Invention Grant
- Patent Title: Method for fabricating metal redistribution layer
- Patent Title (中): 制造金属再分配层的方法
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Application No.: US13085460Application Date: 2011-04-12
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Publication No.: US08173539B1Publication Date: 2012-05-08
- Inventor: Pei-Lin Huang , Chun-Yen Huang , Yuan-Yuan Lin , Yu Shan Chiu , Yi-Min Tseng
- Applicant: Pei-Lin Huang , Chun-Yen Huang , Yuan-Yuan Lin , Yu Shan Chiu , Yi-Min Tseng
- Applicant Address: TW Taoyuan
- Assignee: Nanya Technology Corporation
- Current Assignee: Nanya Technology Corporation
- Current Assignee Address: TW Taoyuan
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A method for fabricating a metal redistribution layer is described. A first opening and a second opening are formed in a dielectric layer over a first region and a second region thereof, respectively. A plurality of third openings are formed in the dielectric layer exposed by the first opening in the first region and a plurality of fourth openings are formed in the dielectric layer exposed by the second opening in the second region. A metal material is formed over the dielectric layer and in the first, second, third and fourth openings. A plurality of recesses is formed in the metal materials overlying the third and fourth openings. The metal material in the first region is patterned by using the recesses formed in portions of the metal material overlying the fourth openings in the second region as an alignment mark to form a metal redistribution layer.
Information query
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