Invention Grant
US08173948B2 Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner 有权
一种用于以局部方式成像和形成硅化物的双柱带电粒子束工具的光耦合装置

  • Patent Title: Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
  • Patent Title (中): 一种用于以局部方式成像和形成硅化物的双柱带电粒子束工具的光耦合装置
  • Application No.: US12582553
    Application Date: 2009-10-20
  • Publication No.: US08173948B2
    Publication Date: 2012-05-08
  • Inventor: Chun-Cheng Tsao
  • Applicant: Chun-Cheng Tsao
  • Applicant Address: US CA Fremont
  • Assignee: DCG Systems, Inc.
  • Current Assignee: DCG Systems, Inc.
  • Current Assignee Address: US CA Fremont
  • Agency: Nixon Peabody LLP
  • Agent Joseph Bach, Esq.
  • Main IPC: G01J1/42
  • IPC: G01J1/42
Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
Abstract:
An optical coupling apparatus for a dual column charged particle beam tool allowing both optical imaging of an area of an integrated circuit, as well as localized heating of the integrated circuit to form silicide. In one embodiment, optical paths from a whitelight source and a laser source are coupled together by way of first and second beam splitters so that a single optical port of the dual column tool may be utilized for both imaging and heating. In another embodiment, a single laser source is employed to provide both illumination for standard microscopy-type imaging, as well as localized heating. In a third embodiment, a single laser source provides heating along with localized illumination for confocal scanning microscopy-type imaging.
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