Invention Grant
US08173959B1 Real-time trace detection by high field and low field ion mobility and mass spectrometry
有权
通过高场和低场离子迁移率和质谱的实时跟踪检测
- Patent Title: Real-time trace detection by high field and low field ion mobility and mass spectrometry
- Patent Title (中): 通过高场和低场离子迁移率和质谱的实时跟踪检测
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Application No.: US11941939Application Date: 2007-11-17
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Publication No.: US08173959B1Publication Date: 2012-05-08
- Inventor: Saïd Boumsellek , Thomas J. Kuehn
- Applicant: Saïd Boumsellek , Thomas J. Kuehn
- Applicant Address: US MA Wilmington
- Assignee: Implant Sciences Corporation
- Current Assignee: Implant Sciences Corporation
- Current Assignee Address: US MA Wilmington
- Agent Jerry Turner Sewell
- Main IPC: H01J49/26
- IPC: H01J49/26

Abstract:
A trace detection system includes at least two stages coupled to operate in series. An ion mobility spectrometer (IMS) stage has a sampling inlet to receive a sample to be analyzed. An ion source ionizes the sample. The IMS applies an electrical field to the ionized sample to move the ionized sample toward an IMS outlet. A differential mobility spectrometer (DMS) stage coupled in series with the IMS stage receives the ionized sample from the IMS stage. Preferably, the system includes a mass spectrometer (MS) stage coupled in series with the DMS stage to receive the ionized sample from the DMS stage via a vacuum interface. A roughing vacuum pump evacuates a first stage of the MS stage to a first pressure below atmospheric pressure. A high vacuum pump evacuates a second stage of the MS stage to a second pressure below the first pressure.
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