Invention Grant
- Patent Title: Sample transfer unit and sample transferring method
- Patent Title (中): 样品转印单元和样品转印方法
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Application No.: US12788037Application Date: 2010-05-26
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Publication No.: US08173971B2Publication Date: 2012-05-08
- Inventor: Takashi Gunji , Hidetoshi Sato , Katsuya Kawakami , Hideki Yatabe
- Applicant: Takashi Gunji , Hidetoshi Sato , Katsuya Kawakami , Hideki Yatabe
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2007-049618 20070228
- Main IPC: G01B15/00
- IPC: G01B15/00 ; H01L21/677

Abstract:
There is provided a mini environment type transfer unit which can efficiently transfer a sample to a critical dimension scanning electron microscope (CD-SEM) even in the case of use of a SMIF pod which can store only one photomask. In addition to a load port, a stocker which can store a plurality of photomasks is provided in the mini environment type transfer unit. A mask storage slot in which a plurality of storage units are stacked is provided in the stocker, and one photomask is stored in each storage unit. A sensor is provided in each storage unit to determine whether or not the photomask is normally stored. Additionally, a sensor is provided in each storage unit to detect whether or not the photomask exists.
Public/Granted literature
- US20100230592A1 Sample Transfer Unit and Sample Transferring Method Public/Granted day:2010-09-16
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