Invention Grant
- Patent Title: Resistive random access memory device and methods of manufacturing and operating the same
- Patent Title (中): 电阻式随机存取存储器件及其制造和操作方法
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Application No.: US12149809Application Date: 2008-05-08
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Publication No.: US08173989B2Publication Date: 2012-05-08
- Inventor: Chang-bum Lee , Young-soo Park , Xianyu Wenxu , Bo-soo Kang , Seung-eon Ahn
- Applicant: Chang-bum Lee , Young-soo Park , Xianyu Wenxu , Bo-soo Kang , Seung-eon Ahn
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2007-0052918 20070530; KR10-2008-0020589 20080305
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L47/00 ; H01L29/02 ; H01L29/04 ; H01L29/76 ; G11C11/00

Abstract:
Provided may be a resistive random access memory (RRAM) device and methods of manufacturing and operating the same. The resistive random access memory device may include at least one first electrode, at least one second electrode spaced apart from the at least one first electrode, a first structure including a first resistance-changing layer between the at least one first and second electrodes, and a first switching element electrically connected to the first resistance-changing layer, wherein at least one of the first and second electrodes include an alloy layer having a noble metal and a base metal.
Public/Granted literature
- US20080296550A1 Resistive random access memory device and methods of manufacturing and operating the same Public/Granted day:2008-12-04
Information query
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