Invention Grant
- Patent Title: Gate-all-around nanowire tunnel field effect transistors
- Patent Title (中): 栅极全能纳米线隧道场效应晶体管
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Application No.: US12630942Application Date: 2009-12-04
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Publication No.: US08173993B2Publication Date: 2012-05-08
- Inventor: Sarunya Bangsaruntip , Josephine B. Chang , Isaac Lauer , Jeffrey W. Sleight
- Applicant: Sarunya Bangsaruntip , Josephine B. Chang , Isaac Lauer , Jeffrey W. Sleight
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: H01L29/12
- IPC: H01L29/12

Abstract:
A method for forming a nanowire tunnel field effect transistor (FET) device includes forming a nanowire suspended by first and second pad regions over a semiconductor substrate, the nanowire including a core portion and a dielectric layer, forming a gate structure around a portion of the dielectric layer, forming a first spacer around portions of the nanowire extending from the gate structure, implanting ions in a first portion of the nanowire, implanting ions in the dielectric layer of a second portion of the nanowire, removing the dielectric layer from the second portion of the nanowire, removing the core portion of the second portion of the exposed nanowire to form a cavity, and epitaxially growing a doped semiconductor material in the cavity from exposed cross sections of the nanowire and the second pad region to connect the exposed cross sections of the nanowire to the second pad region.
Public/Granted literature
- US20110133169A1 Gate-All-Around Nanowire Tunnel Field Effect Transistors Public/Granted day:2011-06-09
Information query
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