Invention Grant
US08174271B2 Capacitance change measuring circuit of capacitive sensor device, capacitive sensor module, method of measuring capacitance change of capacitive sensor device, and electronic device
失效
电容传感器装置的电容变化测量电路,电容式传感器模块,电容式传感器装置的电容变化测量方法以及电子装置
- Patent Title: Capacitance change measuring circuit of capacitive sensor device, capacitive sensor module, method of measuring capacitance change of capacitive sensor device, and electronic device
- Patent Title (中): 电容传感器装置的电容变化测量电路,电容式传感器模块,电容式传感器装置的电容变化测量方法以及电子装置
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Application No.: US12537757Application Date: 2009-08-07
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Publication No.: US08174271B2Publication Date: 2012-05-08
- Inventor: Hisato Hirasaka , Osamu Nakamura , Toshiyuki Hirose , Toshihiko Hirose , Hitoshi Ozawa , Akira Itou
- Applicant: Hisato Hirasaka , Osamu Nakamura , Toshiyuki Hirose , Toshihiko Hirose , Hitoshi Ozawa , Akira Itou
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Rockey, Depke & Lyons, LLC
- Agent Robert J. Depke
- Priority: JP2008-206443 20080808; JP2008-243081 20080922
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G06K9/00

Abstract:
Scanning rate in a capacitance change measuring circuit for a capacitive sensor device is enhanced. The circuit includes: an electrode drive section line-sequentially applying an input pulse signal to a plurality of columns of first electrode patterns in the capacitive sensor device; a peak hold circuit storing a peak level of a detection signal extracted from each column of second electrode patterns into a capacitive element as a corresponding potential; a current source initializing the potential in the capacitive element within one period of the input pulse signal; a comparator comparing the potential in the capacitive element with a reference value; and determination sections each determining whether or not an input operation using a human body or the like is executed, based on a timing information and a reference timing information, the timing information representing a timing when the potential held in the capacitive element crosses the reference value.
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