Invention Grant
- Patent Title: Test board and test system
- Patent Title (中): 测试板和测试系统
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Application No.: US12283872Application Date: 2008-09-16
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Publication No.: US08174278B2Publication Date: 2012-05-08
- Inventor: Nam-Joong Lee , Weon-Tark Kang
- Applicant: Nam-Joong Lee , Weon-Tark Kang
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello, LLP
- Priority: KR10-2007-0094008 20070917
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A test board includes a socket, a mounting test circuit, and a relay. An analog core embedded application processor is installed into the socket. The mounting test circuit has a same configuration as an environment where the analog core embedded application processor is actually used. The relay disconnects the mounting test circuit from the socket in response to a first control signal when a vector test is performed on the analog core embedded application processor, and that connects the mounting test circuit to the socket in response to a second control signal when a mounting set test is performed on the analog core embedded application processor.
Public/Granted literature
- US20090076747A1 Test board and test system Public/Granted day:2009-03-19
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