Invention Grant
- Patent Title: Digital phase detector, and digital phase locked loop including the same
- Patent Title (中): 数字相位检测器和数字锁相环包括相同
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Application No.: US12718509Application Date: 2010-03-05
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Publication No.: US08174324B2Publication Date: 2012-05-08
- Inventor: Tae-Wook Kim , Hee-Mun Bang , Heung-Bae Lee
- Applicant: Tae-Wook Kim , Hee-Mun Bang , Heung-Bae Lee
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2009-0022587 20090317
- Main IPC: H03L7/00
- IPC: H03L7/00

Abstract:
A digital phase detector includes a quantization unit that quantizes a frequency of a reference signal to generate reference delay information and reference integer phase information, and quantizes a frequency of an oscillation signal to generate oscillation delay information and oscillation integer phase information. A first conversion unit converts the frequency of the reference signal into reference frequency information based upon the reference delay information and the reference integer phase information. A second conversion unit converts the frequency of the oscillation signal into oscillation frequency information based upon the oscillation delay information and the oscillation integer phase information. A calculation unit converts the reference frequency information and the oscillation frequency information into first and second phase information, respectively, and outputs a digital phase difference between the first phase information and the second phase information.
Public/Granted literature
- US20100237953A1 DIGITAL PHASE DETECTOR, AND DIGITAL PHASE LOCKED LOOP INCLUDING THE SAME Public/Granted day:2010-09-23
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