Invention Grant
US08174507B2 Apparatus and methods for detecting a conductive object at a location
有权
用于检测位置上的导电物体的装置和方法
- Patent Title: Apparatus and methods for detecting a conductive object at a location
- Patent Title (中): 用于检测位置上的导电物体的装置和方法
-
Application No.: US13204543Application Date: 2011-08-05
-
Publication No.: US08174507B2Publication Date: 2012-05-08
- Inventor: Jiang XiaoPing
- Applicant: Jiang XiaoPing
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F3/02 ; G06F3/045 ; G09G5/00 ; H03K17/975
Abstract:
A method and apparatus to detect a conductive object at a location determines a capacitance variation of a first sensor element and a capacitance variation of a second sensor element. The method and apparatus detects a touch at a first location if the capacitance variation of the first sensor element is greater than a reference value and the capacitance variation of the second sensor element is not greater than the reference value. The method and apparatus detects the touch at a second location if the capacitance variation of the first sensor element is not greater than the reference value and the capacitance variation of the second sensor element is greater than the reference value. The method and apparatus detects the touch at a third location if the capacitance variation of the first sensor element and the capacitance variation of the second sensor element are both greater than the reference value.
Public/Granted literature
- US20120044201A1 APPARATUS AND METHODS FOR DETECTING A CONDUCTIVE OBJECT AT A LOCATION Public/Granted day:2012-02-23
Information query
