Invention Grant
- Patent Title: Shape measuring instrument with light source control
- Patent Title (中): 带光源控制的形状测量仪
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Application No.: US12738691Application Date: 2008-07-29
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Publication No.: US08174682B2Publication Date: 2012-05-08
- Inventor: Satoshi Suzuki , Katsuhiro Sato , Yoichi Sano
- Applicant: Satoshi Suzuki , Katsuhiro Sato , Yoichi Sano
- Applicant Address: CH Heerbrugg JP Sagamihara-Shi
- Assignee: Leica Geosystems AG,Hexagon Metrology Kabushiki Kaisha
- Current Assignee: Leica Geosystems AG,Hexagon Metrology Kabushiki Kaisha
- Current Assignee Address: CH Heerbrugg JP Sagamihara-Shi
- Agency: Maschoff Gilmore & Israelsen
- Priority: JP2007-270974 20071018
- International Application: PCT/EP2008/059954 WO 20080729
- International Announcement: WO2009/049939 WO 20090423
- Main IPC: G01C3/18
- IPC: G01C3/18

Abstract:
An optical system of a shape measuring instrument includes a laser diode, a first optical system irradiating an object to be measured with laser beam, a second optical system focusing reflected light from the object to be measured, and a CCD line sensor portion for detecting a laser beam from the second optical system, where the first optical system includes an optical path displacing unit for displacing an optical path for laser beam, the optical path displacing unit includes a glass plate rotating about a rotating axis extending in a direction perpendicular to a displacement plane of the optical path, a rotating unit for the glass plate, and a rotating unit controller, and the rotating unit controller causes a rotation angle of the rotating unit to coincide with a rotation angle of the rotating unit obtained when the maximum value of an amount of light received by the CCD line sensor according to rotation of the rotating unit is measured by the rotating unit controller.
Public/Granted literature
- US20110075126A2 SHAPE MEASURING INSTRUMENT WITH LIGHT SOURCE CONTROL Public/Granted day:2011-03-31
Information query
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