Invention Grant
- Patent Title: Discrete device testing
- Patent Title (中): 分立器件测试
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Application No.: US11591080Application Date: 2006-10-31
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Publication No.: US08174779B2Publication Date: 2012-05-08
- Inventor: Terry Farren , Heng Gong , Yong Shen , Jing Zhang
- Applicant: Terry Farren , Heng Gong , Yong Shen , Jing Zhang
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Main IPC: G11B27/36
- IPC: G11B27/36
Abstract:
One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.
Public/Granted literature
- US20080104449A1 Discrete device testing Public/Granted day:2008-05-01
Information query
