Invention Grant
US08174860B2 Semiconductor memory device having improved voltage transmission path and driving method thereof
有权
具有改善的电压传输路径的半导体存储器件及其驱动方法
- Patent Title: Semiconductor memory device having improved voltage transmission path and driving method thereof
- Patent Title (中): 具有改善的电压传输路径的半导体存储器件及其驱动方法
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Application No.: US13042049Application Date: 2011-03-07
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Publication No.: US08174860B2Publication Date: 2012-05-08
- Inventor: Sun-Won Kang , Seung-Duk Baek
- Applicant: Sun-Won Kang , Seung-Duk Baek
- Applicant Address: KR Maetan-dong, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Maetan-dong, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Consulting, PLLC
- Priority: KR10-2006-0117087 20061124
- Main IPC: G11C5/06
- IPC: G11C5/06 ; G11C5/00 ; H01L23/02 ; H01L23/48

Abstract:
Provided are a semiconductor memory device and a method of driving the device which can improve a noise characteristic of a voltage signal supplied to a memory cell of the device. The semiconductor memory device includes a first semiconductor chip and one or more second semiconductor chips stacked on the first chip. The first chip includes an input/output circuit for sending/receiving a voltage signal, a data signal, and a control signal to/from an outside system. The one or more second semiconductor chips each include a memory cell region for storing data. The second semiconductor chips receive at least one signal through one or more signal paths that are formed outside the input/output circuit of the first chip.
Public/Granted literature
- US20110157952A1 SEMICONDUCTOR MEMORY DEVICE HAVING IMPROVED VOLTAGE TRANSMISSION PATH AND DRIVING METHOD THEREOF Public/Granted day:2011-06-30
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