Invention Grant
- Patent Title: Semiconductor memory device capable of preventing a shift of threshold voltage
- Patent Title (中): 能够防止阈值电压偏移的半导体存储器件
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Application No.: US12538290Application Date: 2009-08-10
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Publication No.: US08174883B2Publication Date: 2012-05-08
- Inventor: Mitsuaki Honma , Noboru Shibata
- Applicant: Mitsuaki Honma , Noboru Shibata
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-311469 20081205
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A memory cell array is connected to a word line and a bit line, and configured so that a plurality of memory cells storing one level of n levels (n is a natural number more than 4) in one memory cell are arrayed in a matrix. A control circuit controls a potential of the word line and the bit line in accordance with input data, and writs data in the memory cell. The control circuit applies a write voltage corresponding to write data to a memory cell. The write voltage differs for each write data. A verify operation is executed for each write data after a write voltage application operation ends with respect to all n levels.
Public/Granted literature
- US20100142271A1 SEMICONDUCTOR MEMORY DEVICE CAPABLE OF PREVENTING A SHIFT OF THRESHOLD VOLTAGE Public/Granted day:2010-06-10
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