Invention Grant
US08174883B2 Semiconductor memory device capable of preventing a shift of threshold voltage 有权
能够防止阈值电压偏移的半导体存储器件

Semiconductor memory device capable of preventing a shift of threshold voltage
Abstract:
A memory cell array is connected to a word line and a bit line, and configured so that a plurality of memory cells storing one level of n levels (n is a natural number more than 4) in one memory cell are arrayed in a matrix. A control circuit controls a potential of the word line and the bit line in accordance with input data, and writs data in the memory cell. The control circuit applies a write voltage corresponding to write data to a memory cell. The write voltage differs for each write data. A verify operation is executed for each write data after a write voltage application operation ends with respect to all n levels.
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