Invention Grant
- Patent Title: Independent well bias management in a memory device
- Patent Title (中): 存储器件中的独立阱偏置管理
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Application No.: US12582458Application Date: 2009-10-20
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Publication No.: US08174893B2Publication Date: 2012-05-08
- Inventor: Akira Goda , Tomoharu Tanaka , Krishna Parat , Prashant Damle , Shafqat Ahmed
- Applicant: Akira Goda , Tomoharu Tanaka , Krishna Parat , Prashant Damle , Shafqat Ahmed
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
Methods for programming a memory device, memory devices configured to perform the disclosed programming methods, and memory systems having a memory device configured to perform the disclosed programming methods, for example, are provided. According to at least one such method, multiple independent semiconductor well regions each having strings of memory cells are independently biased during a programming operation performed on a memory device. Reduced charge leakage may be realized during a programming operation in response to independent well biasing methods.
Public/Granted literature
- US20110090739A1 INDEPENDENT WELL BIAS MANAGEMENT IN A MEMORY DEVICE Public/Granted day:2011-04-21
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