Invention Grant
US08174895B2 Programming non-volatile storage with fast bit detection and verify skip
有权
使用快速位检测编程非易失性存储并进行验证跳过
- Patent Title: Programming non-volatile storage with fast bit detection and verify skip
- Patent Title (中): 使用快速位检测编程非易失性存储并进行验证跳过
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Application No.: US12638853Application Date: 2009-12-15
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Publication No.: US08174895B2Publication Date: 2012-05-08
- Inventor: Changyuan Chen , Jeffrey Lutze , Yingda Dong , Hua-Ling Hsu
- Applicant: Changyuan Chen , Jeffrey Lutze , Yingda Dong , Hua-Ling Hsu
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus & DeNiro LLP
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A set of non-volatile storage elements are subjected to a programming process in order to store data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target. Non-volatile storage elements being programmed to a first set of one or more targets are verified to determine whether they have reached their target and are locked out of further programming if it is determined that they have reached their target. Non-volatile storage elements being programmed to the second set of one or more targets are tested to determine the number of fast programming bits. When the number of fast bits for a particular target is greater than a threshold, then programming stops for the non-volatile storage elements being programmed to the particular target.
Public/Granted literature
- US20110170358A1 PROGRAMMING NON-VOLATILE STORAGE WITH FAST BIT DETECTION AND VERIFY SKIP Public/Granted day:2011-07-14
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