Invention Grant
- Patent Title: Semiconductor memory device and method of testing the same
-
Application No.: US12656521Application Date: 2010-02-02
-
Publication No.: US08174915B2Publication Date: 2012-05-08
- Inventor: Akiyoshi Yamamoto
- Applicant: Akiyoshi Yamamoto
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JPP2009-023906 20090204
- Main IPC: G11C7/00
- IPC: G11C7/00
Abstract:
A device and a method controlling the device are provided. A first command is supplied to the device in synchronization with a clock signal of a first frequency. The first command is to have the device perform a first operation. The frequency of the clock signal is changed from the first frequency to a second frequency higher than the first frequency. The device performs the first operation in synchronization with the clock signal of the second frequency following changing the frequency of the clock signal.
Public/Granted literature
- US20100195426A1 Semiconductor memory device and method of testing the same Public/Granted day:2010-08-05
Information query
