Invention Grant
US08174990B2 Mechanism and system for programmable measurement of aggregate metrics from a dynamic set of nodes
有权
用于可编程测量来自动态集合节点的聚合度量的机制和系统
- Patent Title: Mechanism and system for programmable measurement of aggregate metrics from a dynamic set of nodes
- Patent Title (中): 用于可编程测量来自动态集合节点的聚合度量的机制和系统
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Application No.: US11676074Application Date: 2007-02-16
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Publication No.: US08174990B2Publication Date: 2012-05-08
- Inventor: Asit Dan , Richard P. King , Heiko Ludwig , Andrea Schmidt , Hendrik Wagner
- Applicant: Asit Dan , Richard P. King , Heiko Ludwig , Andrea Schmidt , Hendrik Wagner
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: F. Chau & Associates, LLC
- Agent Louis J. Percello
- Main IPC: H04L12/26
- IPC: H04L12/26

Abstract:
A method for measuring performance of system. The method includes the steps of retrieving a metric definition from a declarative metrics specification, obtaining a list of computing nodes from a database that are currently assigned to the metric definition, obtaining resource data provided by the computing nodes in the list of computing nodes and determining the metric of system performance based on the metric definition and the resource data. The computing nodes in the list of computing nodes are nodes of a cluster of nodes having a dynamically varying node count.
Public/Granted literature
- US20080198757A1 MECHANISM AND SYSTEM FOR PROGRAMMABLE MEASUREMENT OF AGGREGATE METRICS FROM A DYNAMIC SET OF NODES Public/Granted day:2008-08-21
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