Invention Grant
- Patent Title: Apparatus and method of measuring distance using structured light
- Patent Title (中): 使用结构光测量距离的装置和方法
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Application No.: US11987116Application Date: 2007-11-27
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Publication No.: US08175337B2Publication Date: 2012-05-08
- Inventor: Dong-ryeol Park , Woo-yeon Jeong , Seok-won Bang , Hyoung-ki Lee
- Applicant: Dong-ryeol Park , Woo-yeon Jeong , Seok-won Bang , Hyoung-ki Lee
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2006-0133908 20061226
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Provided are an apparatus and method of measuring a distance using structured light. The apparatus includes a binarization unit binarizing an image, an image identification unit identifying an image having connected pixels in the binarized image, a length ratio calculation unit obtaining the length ratio of the major axis of the image having the connected pixels to a minor axis perpendicular to the major axis, a pixel mean calculation unit obtaining the mean of pixel values of the image having the connected pixels, and an image extraction unit extracting an image formed by the light irradiated from the light source, from the images having connected pixels using the length ratio and the mean of the pixel values.
Public/Granted literature
- US20080159595A1 Apparatus and method of measuring distance using structured light Public/Granted day:2008-07-03
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