Invention Grant
US08175467B2 Apparatus, method, and system for detecting a state of an apparatus
有权
用于检测装置状态的装置，方法和系统
- Patent Title: Apparatus, method, and system for detecting a state of an apparatus
- Patent Title (中): 用于检测装置状态的装置，方法和系统
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Application No.: US11452411Application Date: 2006-06-14
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Publication No.: US08175467B2Publication Date: 2012-05-08
- Inventor: Hisashi Shoji , Masaichi Sawada , Osamu Satoh , Yasushi Nakazato , Seiji Hoshino , Hitoshi Shimizu , Takenori Oku , Noboru Tsukude
- Applicant: Hisashi Shoji , Masaichi Sawada , Osamu Satoh , Yasushi Nakazato , Seiji Hoshino , Hitoshi Shimizu , Takenori Oku , Noboru Tsukude
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2005-173460 20050614; JP2005-230748 20050809
- Main IPC: G03G15/00
- IPC: G03G15/00
Abstract:
An apparatus, method, system, computer program, and product, each capable of detecting a state of an apparatus. The apparatus includes a plurality of devices. When at least one of the plurality of devices is determined to be in a first state, a second state of at least one of the plurality of devices is determined. When a state of the apparatus is determined to be in the first state, the second state of another apparatus is determined.
Public/Granted literature
- US20060294252A1 Apparatus, method, and system for detecting a state of an apparatus Public/Granted day:2006-12-28
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