Invention Grant
- Patent Title: Fluorescence analyzing method, fluorescence analyzing apparatus and image detecting method
- Patent Title (中): 荧光分析方法,荧光分析装置和图像检测方法
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Application No.: US11806318Application Date: 2007-05-31
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Publication No.: US08175809B2Publication Date: 2012-05-08
- Inventor: Satoshi Takahashi , Takashi Irie
- Applicant: Satoshi Takahashi , Takashi Irie
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-150883 20060531
- Main IPC: G01N33/48
- IPC: G01N33/48 ; C12Q1/68 ; G06G7/58 ; G06F7/60

Abstract:
A fluorescence analyzing method includes the steps of irradiating a board, to which oligonucleotide is fixed, with light for fluorescence measurement; focusing produced fluorescence to form an image; and detecting the fluorescence with a two-dimensional sensor. Here, the board is provided with plural regions to which the oligonucleotide is fixed, and the plural regions are spaced apart from one another on the board substantially equidistantly in the vertical and horizontal directions. A fluorescent image is detected in a condition where the following equation is satisfied: dd=ds×M/n where ds denotes the interval between the regions, M denotes the imaging magnification of an optical focusing/imaging system, dd denotes the pixel pitch of the two-dimensional sensor, and n denotes an integer (n=1, 2, 3, 4, 5).
Public/Granted literature
- US20070281315A1 Fluorescence analyzing method, fluorescence analyzing apparatus and image detecting method Public/Granted day:2007-12-06
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