Invention Grant
- Patent Title: Sample processing apparatus and sample processing method
- Patent Title (中): 样品处理装置和样品处理方法
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Application No.: US11830557Application Date: 2007-07-30
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Publication No.: US08175810B2Publication Date: 2012-05-08
- Inventor: Atsushi Kitaoka
- Applicant: Atsushi Kitaoka
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2006-213275 20060804
- Main IPC: G01N33/48
- IPC: G01N33/48

Abstract:
A sample processing apparatus prevents samples and reagents from being degraded due to a prolonged waiting time other than for reaction and improves the operation efficiency of the apparatus. The apparatus includes a plurality of processing sections for causing at least two samples to react independently, an input/output terminal 15 for inputting the upper limit of the waiting time and the reaction time for each of the samples, a schedule management section for determining at least the clock time of introducing each of the samples, the processing section to be used for processing the sample and/or the waiting time for the sample, and a general control section for controlling the processing of the samples at the plurality of processing sections according to the determination by the schedule management section.
Public/Granted literature
- US20080028871A1 SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING METHOD Public/Granted day:2008-02-07
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