Invention Grant
- Patent Title: Probing analog signals
- Patent Title (中): 探测模拟信号
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Application No.: US12316900Application Date: 2008-12-17
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Publication No.: US08175823B2Publication Date: 2012-05-08
- Inventor: Amir Mezer , Assaf Benhamou
- Applicant: Amir Mezer , Assaf Benhamou
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Grossman, Tucker, Perreault & Pfleger, PLLC
- Main IPC: H03K5/153
- IPC: H03K5/153
Abstract:
A device, comprising a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage and an operative unit adapted to perform a task of the device and provide a result without using digital outputs from the monitoring slicer.
Public/Granted literature
- US20100153032A1 Probing analog signals Public/Granted day:2010-06-17
Information query
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