Invention Grant
- Patent Title: RF probe technique for determining plasma potential
- Patent Title (中): 用于确定等离子体电位的RF探针技术
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Application No.: US13181556Application Date: 2011-07-13
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Publication No.: US08175827B2Publication Date: 2012-05-08
- Inventor: David N. Walker , Richard F. Fernsler , David D. Blackwell , William E. Amatucci
- Applicant: David N. Walker , Richard F. Fernsler , David D. Blackwell , William E. Amatucci
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee: The United States of America as represented by the Secretary of the Navy
- Current Assignee Address: US DC Washington
- Agent Amy Ressing; Joslyn Barritt
- Main IPC: G01R27/00
- IPC: G01R27/00

Abstract:
An rf probe is placed within a plasma and an rf signal from a network analyzer for a given dc bias voltage Vp is applied The frequency applied by the network analyzer, ω, is less than the plasma frequency, ωpe, and therefore is not in the resonant absorption range (ω=ωpe) used to determine electron density in typical rf impedance probe operation. Bias voltages at the applied frequency are applied to the probe in a series of voltage steps in a range which includes the plasma potential. At each bias step, a value of Re(Zac), the real part of the plasma's complex impedance, is returned by the analyzer. A local minimum in the real part of the impedance Re(Zac) occurs where the applied bias voltage Vp equals the plasma potential φp. The plasma potential φp can be found by taking the first derivative of Re(Zac) with respect to Vp, ⅆ ( Re ( Z a c ) ⅆ V p , and finding the value of Vp at which ⅆ ( Re ( Z a c ) ⅆ V p = 0 within error tolerances.
Public/Granted literature
- US20120046895A1 RF Probe Technique for Determining Plasma Potential Public/Granted day:2012-02-23
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