Invention Grant
- Patent Title: Sampling mechanism for data acquisition counters
- Patent Title (中): 数据采集计数器采样机制
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Application No.: US11768255Application Date: 2007-06-26
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Publication No.: US08176351B2Publication Date: 2012-05-08
- Inventor: Rafael Castro , Brian Keith Odom
- Applicant: Rafael Castro , Brian Keith Odom
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood
- Main IPC: H04B1/38
- IPC: H04B1/38

Abstract:
One or more counter units of a data acquisition device used to perform sampling operations. Each of the counter units is configurable to operate in a selected one of a plurality of modes. During operation, at least one of the counter units may receive a measurement signal (or input signal) acquired by the data acquisition device and also a sample clock signal. The counter unit may sample the measurement signal based on the selected operational mode and timing of the sample clock, and at a rate that is independent of the frequency of the measurement signal. Furthermore, the counter unit may sample the measurement signal based on a selected one of a plurality of timing modes associated with the sample clock signal. The counter units may take samples of the measurement signal to perform at least one of the following types of measurements: period, frequency, pulse-width, semi-period, time separation, or event counting.
Public/Granted literature
- US20080043826A1 Sampling Mechanism for Data Acquisition Counters Public/Granted day:2008-02-21
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