Invention Grant
- Patent Title: Online multiprocessor system reliability defect testing
- Patent Title (中): 在线多处理器系统可靠性缺陷测试
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Application No.: US12053642Application Date: 2008-03-24
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Publication No.: US08176362B2Publication Date: 2012-05-08
- Inventor: Monty M Denneau , Vikram Iyengar , Phillip J. Nigh
- Applicant: Monty M Denneau , Vikram Iyengar , Phillip J. Nigh
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Michael LeStrange
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A multiprocessor system comprising a plurality of processors is disclosed. The plurality of processors includes a first processor including first monitor on-chip and a second processor including a including a second monitor on-chip. The first monitor on-chip is configured to measure load on the second processor and the second monitor on-chip is configured to measure load on the first processor. The first monitor on-chip is configured to cause the second monitor on-chip to perform a self-test on the second processor if the load on the second processor is below a second processor load threshold value and the second monitor on-chip is configured to cause the first monitor on-chip to perform a self-test on the first processor if the load on the first processor is below first processor load threshold value.
Public/Granted literature
- US20090241124A1 ONLINE MULTIPROCESSOR SYSTEM RELIABILITY DEFECT TESTING Public/Granted day:2009-09-24
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