Invention Grant
US08176400B2 Systems and methods for enhanced flaw scan in a data processing device
有权
用于在数据处理设备中增强缺陷扫描的系统和方法
- Patent Title: Systems and methods for enhanced flaw scan in a data processing device
- Patent Title (中): 用于在数据处理设备中增强缺陷扫描的系统和方法
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Application No.: US12556180Application Date: 2009-09-09
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Publication No.: US08176400B2Publication Date: 2012-05-08
- Inventor: Weijun Tan , Shaohua Yang , Hongwei Song , Richard Rauschmayer
- Applicant: Weijun Tan , Shaohua Yang , Hongwei Song , Richard Rauschmayer
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hamilton, DeSanctis & Cha
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
Various embodiments of the present invention provide systems and methods for flaw scan in a data processing system. As one example, a data processing system is disclosed that includes a data detector circuit, a bit sign inverting circuit, and an LDPC decoder circuit. The data detector circuit receives a verification data set that is an invalid LDPC codeword, and applies a data detection algorithm to the verification data set to yield a detected output. The bit sign inverting circuit modifies the sign of one or more elements of a first derivative of the detected output to yield a second derivative of the detected output. The second derivative of the detected output is an expected valid LDPC codeword. The LDPC decoder circuit applies a decoding algorithm to the second derivative of the detected output to yield a decoded output.
Public/Granted literature
- US20110058631A1 Systems and Methods for Enhanced Flaw Scan in a Data Processing Device Public/Granted day:2011-03-10
Information query
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