Invention Grant
- Patent Title: Systems and methods for stepped data retry in a storage system
- Patent Title (中): 存储系统中步进数据重试的系统和方法
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Application No.: US12556145Application Date: 2009-09-09
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Publication No.: US08176404B2Publication Date: 2012-05-08
- Inventor: Shaohua Yang , Weijun Tan , Yuan Xing Lee
- Applicant: Shaohua Yang , Weijun Tan , Yuan Xing Lee
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hamilton, DeSanctis & Cha
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Various embodiments of the present invention provide systems and methods for data processing retries. As an example, a data processing retry circuit is discussed that includes a stepped erasure window register, and an erasure flag set circuit. The stepped erasure window register includes: an erasure flag location, an erasure flag length, and a step size. The erasure flag set circuit is operable to assert a first erasure flag beginning at the erasure flag location and having the erasure flag length at a first time. In addition, the erasure flag set circuit is operable to assert a second erasure flag beginning at the erasure flag location plus the step size, and having the erasure flag length at a second time.
Public/Granted literature
- US20110060973A1 Systems and Methods for Stepped Data Retry in a Storage System Public/Granted day:2011-03-10
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