Invention Grant
US08176461B1 Design-specific performance specification based on a yield for programmable integrated circuits 有权
基于可编程集成电路产量的设计特定性能规范

  • Patent Title: Design-specific performance specification based on a yield for programmable integrated circuits
  • Patent Title (中): 基于可编程集成电路产量的设计特定性能规范
  • Application No.: US12776934
    Application Date: 2010-05-10
  • Publication No.: US08176461B1
    Publication Date: 2012-05-08
  • Inventor: Stephen M. Trimberger
  • Applicant: Stephen M. Trimberger
  • Applicant Address: US CA San Jose
  • Assignee: Xilinx, Inc.
  • Current Assignee: Xilinx, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent LeRoy D. Maunu; Lois D. Cartier
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Design-specific performance specification based on a yield for programmable integrated circuits
Abstract:
A method for generating a design-specific timing specification includes inputting a first timing specification of a target device corresponding to a first timing yield. The first timing specification contains timing delays of elements located in at least first and second regions of the target device. A circuit design is placed and routed. With a programmed processor, the timing delay of the first timing specification is increased for one or more elements implementing the circuit design in the first region to produce a second timing specification, and a second timing yield of target device is determined from the second timing specification. In response to the second timing yield being larger than a target timing yield, the programmed processor decreases the timing delay of the second timing specification for one or more elements in the second region to compensate for a difference between the second timing yield and the target timing yield to produce a design-specific timing specification.
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