Invention Grant
US08176778B2 Capacitive level sensor with a plurality of segments comprising each a capacitor and a circuit 有权
具有包括电容器和电路的多个段的电容式液位传感器

  • Patent Title: Capacitive level sensor with a plurality of segments comprising each a capacitor and a circuit
  • Patent Title (中): 具有包括电容器和电路的多个段的电容式液位传感器
  • Application No.: US11988608
    Application Date: 2006-07-11
  • Publication No.: US08176778B2
    Publication Date: 2012-05-15
  • Inventor: Kees SchoenmakersJan Slezak
  • Applicant: Kees SchoenmakersJan Slezak
  • Applicant Address: DE München
  • Assignee: Siemens Aktiengesellschaft
  • Current Assignee: Siemens Aktiengesellschaft
  • Current Assignee Address: DE München
  • Priority: EP05015019 20050711
  • International Application: PCT/EP2006/064113 WO 20060711
  • International Announcement: WO2007/006788 WO 20070118
  • Main IPC: G01F23/26
  • IPC: G01F23/26
Capacitive level sensor with a plurality of segments comprising each a capacitor and a circuit
Abstract:
A capacitive level sensor comprises a probe which is longitudinally segmented into a plurality of segments. Each segment comprises an electrode forming an electrical capacitor to a common ground electrode. Each electrode is connected to a measuring circuit via an associated one of a plurality of controllable switches. A control means controls said switches to successively and separately connect the capacitors to the measuring circuit. To simplify the design and manufacture of the level sensor, the controllable switches are individually arranged in the associated segments of the probe, and the control means is subdivided into control units respectively arranged in the segments and connected to a single control line. Alternatively, if a plurality of controllable measuring circuits are individually arranged in the associated segments and connected to an associated one of said electrodes, and if the control means successively and separately activates the measuring circuits, the control means is subdivided into control units respectively arranged in the segments of the probe and connected to a single control line.
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