Invention Grant
- Patent Title: Method for the identification of the clonal source of a restriction fragment
- Patent Title (中): 用于鉴定限制性片段的克隆源的方法
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Application No.: US12373220Application Date: 2007-07-10
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Publication No.: US08178300B2Publication Date: 2012-05-15
- Inventor: Michael Josephus Theresia Van Eijk , Taco Peter Jesse
- Applicant: Michael Josephus Theresia Van Eijk , Taco Peter Jesse
- Applicant Address: NL Wageningen
- Assignee: Keygene N.V.
- Current Assignee: Keygene N.V.
- Current Assignee Address: NL Wageningen
- Agency: Foley & Lardner LLP
- International Application: PCT/NL2007/000177 WO 20070710
- International Announcement: WO2008/007951 WO 20080117
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C12P19/34

Abstract:
The present invention relates to a high throughput method for the identification and detection of molecular markers wherein restriction fragments are generated and suitable adaptors comprising (sample-specific) identifiers are ligated. The adapter-ligated restriction fragments may be selectively amplified with adaptor compatible primers carrying selective nucleotides at their 3′ end. The amplified adapter-ligated restriction fragments are, at least partly, sequenced using high throughput sequencing methods and the sequence parts of the restriction fragments together with the sample-specific identifiers serve as molecular markers.
Public/Granted literature
- US20090246780A1 HIGH THROUGHPUT PHYSICAL MAPPING USING AFLP Public/Granted day:2009-10-01
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