Invention Grant
US08178445B2 Substrate processing apparatus and manufacturing method of semiconductor device using plasma generation
有权
基板处理装置及使用等离子体发生的半导体装置的制造方法
- Patent Title: Substrate processing apparatus and manufacturing method of semiconductor device using plasma generation
- Patent Title (中): 基板处理装置及使用等离子体发生的半导体装置的制造方法
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Application No.: US12801444Application Date: 2010-06-09
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Publication No.: US08178445B2Publication Date: 2012-05-15
- Inventor: Tadashi Horie , Akito Hirano , Tadashi Terasaki
- Applicant: Tadashi Horie , Akito Hirano , Tadashi Terasaki
- Applicant Address: JP Tokyo
- Assignee: Hitachi Kokusai Electric Inc.
- Current Assignee: Hitachi Kokusai Electric Inc.
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2009-139198 20090610; JP2010-131794 20100609
- Main IPC: H01L21/31
- IPC: H01L21/31

Abstract:
A manufacturing method for a semiconductor device, that loads a substrate on which a film containing oxygen atoms, chlorine atoms, and metal atoms is formed into a processing chamber so as to be supported by a substrate support part. The substrate is heated by the substrate support part. The inside of the processing chamber is exhausted by a gas exhaust part while supplying nitrogen atoms-containing gas and hydorgen atoms-containing gas into the processing chamber by a gas supply part. A plasma generation part is then used to excite the nitrogen atoms-containing gas and the hydrogen atoms-containing gas supplied into the processing chamber.
Public/Granted literature
- US20100317199A1 Substrate processing apparatus and manufacturing method of semiconductor device Public/Granted day:2010-12-16
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